McKeown, JT and Radmilovic, Velimir R and Gronsky, R and Glaeser, AM (2011) Silicide Characterization at Alumina–niobium Interfaces. Journal of Materials Science, 46 (11). p. 3969. ISSN 0022-2461 (FP7- 245916)
|
Text
245916-2011-3969-McKeown.pdf - Published Version Download (658Kb) | Preview |
Abstract
Alumina–niobium interfaces formed by liquidfilm-assisted joining with copper/niobium/copper interlayers exhibited microstructures that depend on the nature of the alumina components. Characterization of these interfaces in the transmission electron microscope provided insight on the relationship between interfacial microstructure and fracture performance. Interfaces between sapphire and niobium and those between high-purity (99.9%) polycrystalline alumina and niobium were free of secondary phases. However, niobium silicides were found at interfaces between lower-purity (99.5%) alumina and niobium, identified by electron diffraction analysis as the body-centered tetragonal a-Nb5Si3 phase. Spatially resolved compositional analysis was conducted on silicide particles at and away from the interface.
Funders
U.S. Department of EnergyEU
Projects
DE-AC03-76SF00098, DE-FG02-02ER45996 and DE-AC02-05CH11231NANOTECH FTM
| Item Type: | Article |
|---|---|
| FP7 Grant Agreement Number: | 245916 |
| FrameWork Programmes: | SP4-Capacities |
| Scientific Areas: | Research Potential |
| Contact Email Address: | mckeown3@llnl.gov |
| Last Modified: | 13 Aug 2012 11:46 |
| Access rights: | Open access |
| Output type: | Article |
| URI: | http://eprints.kobson.nb.rs/id/eprint/31 |
Actions (login required)
 |
View Item |
